WM100
白光干涉儀
MAHR
WM100
白光干涉儀
MARSURF WM 100 3D SURFACE MEASUREMENT
白光干涉儀
白光干涉儀
產品介紹
High-precision white light interferometry. The MarSurf WM 100 with new camera and functionally
en larged Interferometer Software offers sub-nanometer resolution and precision.
Key benefits:
Maximum precision with sub-nanometer resolution and measuring accuracy
Fast and simple measurements- reliable results
Suitable for all optical and reflective surfaces, fine technical surfaces and surfaces of circuit boards, semi-conductor products and biological tissue
Three different measuring modes: VSI, EPSI and PSI
Special evaluation mode for small steps
2D surface analysis and measurement evaluations
Topographical 3D surface analysis and measurement evaluations
Manual table and object positioning in up to 4 axes
Wide choice of lenses for perfect adjustment to the measuring object
Sturdy design with granite base plate
en larged Interferometer Software offers sub-nanometer resolution and precision.
Key benefits:
Maximum precision with sub-nanometer resolution and measuring accuracy
Fast and simple measurements- reliable results
Suitable for all optical and reflective surfaces, fine technical surfaces and surfaces of circuit boards, semi-conductor products and biological tissue
Three different measuring modes: VSI, EPSI and PSI
Special evaluation mode for small steps
2D surface analysis and measurement evaluations
Topographical 3D surface analysis and measurement evaluations
Manual table and object positioning in up to 4 axes
Wide choice of lenses for perfect adjustment to the measuring object
Sturdy design with granite base plate
