TWI60
斜波干涉儀非球面量測
MAHR
TWI60
MAROPTO TWI 60 TILTED WAVE INTERFEROMETER
產品介紹
Tilted Wave Interferometer for the quick and flexible measurement and analysis of aspherical lenses.
The Tilted Wave Interferometer (MarOpto TWI 60) is a new and highly flexible interferometer for the quick and high precision measurement of aspheres.
The second picture shows the surface deviations measured in the A5 demonstrator asphere (free aperture 50 mm, best fit radius 40.8 mm, deviation from best-fit sphere 600 µm, gradient deviation 8°).
The lateral resolution is approx. 30 µm. During the data acquisition time of approximately 30 seconds, the entire surface of the asphere is measured at a high lateral resolution and with low measurement uncertainty. Most importantly, neither a CGH (Computer Generated Hologram) nor stitching is required.
Flexible interferometric measurements of aspherical lenses without CGH
Measurements without the need for stitching
Short data acquisition time of approximately 30 s
Beam diameter 100 mm
Permitted aspherical deviation compared to a best-fit sphere approximately 1.5 mm
The Tilted Wave Interferometer (MarOpto TWI 60) is a new and highly flexible interferometer for the quick and high precision measurement of aspheres.
The second picture shows the surface deviations measured in the A5 demonstrator asphere (free aperture 50 mm, best fit radius 40.8 mm, deviation from best-fit sphere 600 µm, gradient deviation 8°).
The lateral resolution is approx. 30 µm. During the data acquisition time of approximately 30 seconds, the entire surface of the asphere is measured at a high lateral resolution and with low measurement uncertainty. Most importantly, neither a CGH (Computer Generated Hologram) nor stitching is required.
Flexible interferometric measurements of aspherical lenses without CGH
Measurements without the need for stitching
Short data acquisition time of approximately 30 s
Beam diameter 100 mm
Permitted aspherical deviation compared to a best-fit sphere approximately 1.5 mm
